CFET Beyond 3 nm: SRAM Reliability Under Design-Time and Run-Time Variability by Sufia Shahin, Swati Deshwal, Anirban Kar, Mahdi Benkhelifa, Yogesh S. Chauhan, Hussam Amrouch

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Insights Into Threshold Voltage Variability in Negative Capacitance Junctionless Transistor by Ruma S. R., Vita-Pi Ho Hu, Manish Gupta

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An In-Memory-Computing Binary Neural Network Architecture With In-Memory Batch Normalization by Prathamesh Prashant Rege, Ming Yin, Sanjay Parihar, Joseph Versaggi, Shashank Nemawarkar

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Expressions for the First Two Moments of the Range of Normal Random Variables with Applications to the Range Control Chart by Don G. Wardell

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Spintronic Content Addressable Memory With Integrated Boolean Logic and Arithmetic Functions by Zahra Mehdizadeh Taheri, Sayed Masoud Sayedi, Mohammad Hossein Moaiyeri

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