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Devices for express diagnostics of power semiconductor devices and semiconductor converters
Published 2023-06-01“…The method is proposed for determining potentially unreliable power semiconductor devices in group connections based on the results of analyzing the distribution of reverse currents in parallel branches, which made it possible to create a series of devices for diagnosing power semiconductor devices in converters, both with and without communication resistors. …”
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500 V breakdown voltage in β‐Ga2O3 laterally diffused metal‐oxide‐semiconductor field‐effect transistor with 108 MW/cm2 power figure of merit
Published 2023-07-01Subjects: Get full text
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Thermal analysis of onboard front-end AC/DC converter for EV using advanced semiconductor devices
Published 2025-03-01Subjects: Get full text
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2 kV Al0.64Ga0.36N-channel high electron mobility transistors with passivation and field plates
Published 2025-01-01Subjects: Get full text
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Wide‐Bandgap Nickel Oxide with Tunable Acceptor Concentration for Multidimensional Power Devices
Published 2025-01-01Subjects: Get full text
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A lightweight multi scale fusion network for IGBT ultrasonic tomography image segmentation
Published 2025-01-01“…Abstract The Insulated Gate Bipolar Transistor (IGBT) is a crucial power semiconductor device, and the integrity of its internal structure directly influences both its electrical performance and long-term reliability. …”
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EV Hybrid Battery With Integrated Multilevel Neutral-Point-Clamped Interfacing and Lossless Intermodule State-of-Charge Balancing
Published 2025-01-01“…Overall, the proposed approach enables a modular and scalable design of the energy storage system for a wide range of electric vehicles, from only two different standard battery modules and a standard power semiconductor device, while optimizing the battery size for any given battery power and energy specification. …”
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A fault‐diagnosis and tolerant control technique for five‐level cascaded H‐bridge inverters
Published 2021-07-01“…The consequences of faults increase as the number of power semiconductor devices increases and may lead to serious damage to the overall system. …”
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ESTIMATION OF THERMAL PARAMETERS OF POWER BIPOLAR TRANSISTORS BY THE METHOD OF THERMAL RELAXATION DIFFERENTIAL SPECTROMETRY
Published 2015-12-01“…Method of thermal relaxation differential spectrometry allows effectively control the distribution of heat flow in high-power semiconductor devices, which is important for improving the design, improve the quality of landing crystals of power electronics products to reduce overheating.…”
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