Showing 1 - 2 results of 2 for search '"positive bias temperature instability (PBTI)"', query time: 0.03s Refine Results
  1. 1
    Stability of GaN HEMT Device Under Static and Dynamic Gate Stress

    Stability of GaN HEMT Device Under Static and Dynamic Gate Stress by Linfei Gao, Ze Zhong, Qiyan Zhang, Xiaohua Li, Xinbo Xiong, Shaojun Chen, Longkou Chen, Huaibao Yan, Anle Zhang, Jiajun Han, Wenrong Zhuang, Feng Qiu, Hsien-Chin Chiu, Shuangwu Huang, Xinke Liu

    Published 2024-01-01
    Subjects:
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs

    Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs by Myeongsu Chae, Ho-Young Cha, Hyungtak Kim

    Published 2024-01-01
    Subjects:
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: