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    Contactless defects detection using modulated photoluminescence technique: model for a single Shockley-Read-Hall trap in a semiconductor thin layer

    Contactless defects detection using modulated photoluminescence technique: model for a single Shockley-Read-Hall trap in a semiconductor thin layer by Bérenguier Baptiste, Asseko Alban, Haddara Hiba, Le Gall Sylvain, Kleider Jean-Paul, Guillemoles Jean-François

    Published 2025-01-01
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