Showing 601 - 620 results of 759 for search '"optoelectronic"', query time: 0.05s Refine Results
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    Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon by Ying Chang, Saisai He, Mingyuan Sun, Aixia Xiao, Jiaxin Zhao, Lulu Ma, Wei Qiu

    Published 2021-01-01
    “…Monocrystalline silicon (c-Si) is still an important material related to microelectronics/optoelectronics. The nondestructive measurement of the c-Si material and its microstructure is commonly required in scientific research and industrial applications, for which Raman spectroscopy is an indispensable method. …”
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    Interface dipole evolution from the hybrid coupling between nitrogen-doped carbon quantum dots and polyethylenimine featuring the electron transport thin layer at Al/Si interfaces by Sasimontra Timjan, Ta-Cheng Wei, Kuan-Han Lin, Yi-Ting Li, Po-Hsuan Hsiao, Chia-Yun Chen

    Published 2025-01-01
    “…The assessment of electron transport layer (ETL) for rear-contact engineering of silicon (Si) based optoelectronics has been considered as one of the critical challenges that leverage the performance improvement and device reliability. …”
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