Showing 1 - 2 results of 2 for search '"optic and atomic force microscopy"', query time: 0.03s Refine Results
  1. 1
    EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS

    EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

    Published 2015-03-01
    Subjects:
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Crack resistance of carbonized layer of multilayer polyurethane with nanofillers. Combination of casting, solution, carbonization by ion implantation technologies

    Crack resistance of carbonized layer of multilayer polyurethane with nanofillers. Combination of casting, solution, carbonization by ion implantation technologies by R. I. Izyumov, A. L. Svistkov, V. S. Chudinov, I. V. Osorgina, A. G. Pelevin

    Published 2024-01-01
    Subjects: “…digital optical and atomic force microscopy…”
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: