Uncooled Microbolometers Based on Nitrogen-Doped Hydrogenated Amorphous Silicon-Germanium (a-SiGe:H,N) by Oscar Velandia, Alfonso Torres, Alfredo Morales, Luis Hernández, Alberto Luna, Karim Monfil, Javier Flores, Gustavo M. Minquiz, Ricardo Jiménez, Mario Moreno

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Electrophysical properties of vanadium oxide films deposited by reactive magnetron sputtering by T. D. Nguen, A. I. Zanko, D. A. Golosov, S. M. Zavadski, S. N. Melnikov, V. V. Kolos

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Long-Term Radiometric Stability of Uncooled and Shutterless Microbolometer-Based Infrared Cameras by Olivier Gazzano, Mathieu Chambon, Yann Ferrec, Guillaume Druart

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Application of Cad Systems to Accounting for Mechanical Stresses in the Development of Uncooled Thermal Detectors of the Bolometric Type by Tran Van Trieu, I. Yu. Lovshenko, V. R. Stempitsky, K. V. Korsak, Tran Tuan Trung, Dao Dinh Ha, V. V. Kolos

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Design and Performance of Amorphous Silicon Based on Uncooled Bolometer-Type Infrared Focal Plane Arrays by Van Trieu Tran, V. R. Stempitsky, I. Yu. Lovshenko, K. V. Korsak, Dinh Ha Dao

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Inverse Design of Metamaterial Absorbers for Far-Infrared CMOS Detectors by Tiantian Shi, Wenbin Zhou, Xiangze Liu, Wei Si, Zhangnan Li, Yiming Liao, Xiaoli Ji

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Formation and investigation of characteristics of thermoresistive structures based on vanadium oxide films by T. D. Nguyen, A. I. Zanko, D. A. Golosov, S. M. Zavadski, S. N. Melnikov, V. V. Kolos, N. К. Тоlochko

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Calculation of Optical Parameters of Thin Films of Structural Materials of Thermal Uncooled Bolometric Type Detector by Van Trieu Tran, K. V. Korsak, P. E. Novikov, I. Yu. Lovshenko, S. M. Zavadski, D. A. Golosov, A. A. Stepanov, A. A. Hubarevich, V. V. Kolos, Ya. A. Solovjov, D. S. Liauchuk, V. R. Stempitsky

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Optical, Mechanical and Electrical Characteristics of Thermal Uncooled Bolometric Type Detector Based on Vanadium Oxide by Van Trieu Tran, K. V. Korsak, P. E. Novikov, I. Yu. Lovshenko, S. M. Zavadski, D. A. Golosov, A. A. Stepanov, A. А. Hubarevich, V. V. Kolos, Ya. A. Solovjov, D. S. Liauchuk, V. R. Stempitsky

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Influence of annealing on structure, phase and electrophysical properties of vanadium oxide films by T. D. Nguen, A. I. Zanko, D. A. Golosov, S. M. Zavadski, S. N. Melnikov, V. V. Kolos, T. Q. To

Subjects: “…microbolometer…”
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