Maximum-likelihood Regression with Systematic Errors for Astronomy and the Physical Sciences. I. Methodology and Goodness-of-fit Statistic of Poisson Data by Massimiliano Bonamente, Yang Chen, Dale Zimmerman

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Devices for express diagnostics of power semiconductor devices and semiconductor converters by E. B. Koroleva, S. M. Kurmashev, K. K. Kim, A. A. Tkachuk, A. A. Kuznetsov

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The concept of creating an electric field strength meter with the determination of the error of the measurement result and the distance to the field source by S. V. Biryukov

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A new method for describing the change of the laser beam axis trajectory in the Anderson differential cuvette to measure the refractive index of liquids by V.V. Davydov, D.S. Provodin, A.A. Gol’dberg, I.D. Kochetkov

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A new optical method for control in visible light of volatile hydrocarbon media and their mixtures using data from light-shadow boundary images by V.V. Davydov, D.V. Vakorina, G.V. Stepanenkov

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