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    Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes

    Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes by Ivan Soldatov, Burak Ozer, Saicharan Aswartham, Sebastian Selter, Louis Veyrat, Bernd Buchner, Rudolf Schafer

    Published 2024-01-01
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