A 0.002‐mm2 8‐bit 1‐MS/s low‐power time‐based DAC (T‐DAC) by Ali H. Hassan, Hassan Mostafa, Mohamed Refky, Khaled N. Salama, Ahmed M. Soliman

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Temperature Monitoring in PIC Surface by Sushma Pandey, Antonio Teixeira, Mario Lima

Subjects: “…photonics integrated circuit…”
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Lightweight AES Design for IoT Applications: Optimizations in FPGA and ASIC With DFA Countermeasure Strategies by Salman Ahmed, Nabihah Ahmad, Nasir Ali Shah, Ghulam E. Mustafa Abro, Ardhi Wijayanto, Abdinasir Hirsi, Abdul Rehman Altaf

Subjects: “…application specific integrated circuits (ASIC)…”
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An Approach to Reduce Tuning Sensitivity in the PIC-Based Optoelectronic Oscillator by Controlling the Phase Shift in Its Feedback Loop by Vladislav Ivanov, Ivan Stepanov, Grigory Voronkov, Ruslan Kutluyarov, Elizaveta Grakhova

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Blinding HT: Hiding Hardware Trojan signals traced across multiple sequential levels by Ying Zhang, Minghui Ge, Xin Chen, Jiaqi Yao, Zhiming Mao

Subjects: “…integrated circuit design…”
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A novel buffering fault‐tolerance approach for network on chip (NoC) by Nima Jafarzadeh, Ahmad Jalili, Jafar A. Alzubi, Khosro Rezaee, Yang Liu, Mehdi Gheisari, Bahram Sadeghi Bigham, Amir Javadpour

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Comparative radio‐frequency and crosstalk analysis of carbon‐based nano‐interconnects by Manjit Kaur, Neena Gupta, Sanjeev Kumar, Balwinder Raj, Arun K. Singh

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Reliability Express Control of the Gate Dielectric of Semiconductor Devices by V. A. Solodukha, G. G. Chigir, V. A. Pilipenko, V. A. Filipenya, V. A. Gorushko

Subjects: “…integrated circuit…”
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Switched CMOS current source compared to enhanced Howland circuit for bio-impedance applications by da Silva Pablo Dutra, Filho Pedro Bertemes

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A Design of Fault-Tolerant Battery Monitoring IC for Electric Vehicles Complying With ISO 26262 by Byambajav Ragchaa, Liji Wu, Xiangmin Zhang

Subjects: “…battery monitoring integrated circuit…”
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A radix‐8 modulo 2n multiplier using area and power‐optimized hard multiple generator by Naveen Kr. Kabra, Zuber M. Patel

Subjects: “…integrated circuit layout…”
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Recycled integrated circuit detection using reliability analysis and machine learning algorithms by Udaya Shankar Santhana Krishnan, Kalpana Palanisamy

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Verification of serialising instructions for security against transient execution attacks by Kushal K. Ponugoti, Sudarshan K. Srinivasan, Nimish Mathure

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Memristor‐transistor hybrid ternary content addressable memory using ternary memristive memory cell by Masoodur Rahman Khan, ABM Harun‐ur Rashid

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Noise‐based logic locking scheme against signal probability skew analysis by Ahmad Rezaei, Ali Mahani

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Ferroelectric memory: state-of-the-art manufacturing and research by D. A. Abdullaev, R. A. Milovanov, R. L. Volkov, N. I. Borgardt, A. N. Lantsev, K. A. Vorotilov, A. S. Sigov

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TVD‐PB logic circuit based on camouflaging circuit for IoT security by Yuejun Zhang, Qiufeng Wu, Pengjun Wang, Liang Wen, Zhicun Luan, Chongyan Gu

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New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

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All‐digital built‐in self‐test scheme for charge‐pump phase‐locked loops by Lanhua Xia, Jifei Tang

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Design of 10T SRAM cell with improved read performance and expanded write margin by Ashish Sachdeva, V. K. Tomar

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