-
1
Recycled integrated circuit detection using reliability analysis and machine learning algorithms
Published 2021-01-01Subjects: Get full text
Article -
2
Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors
Published 1998-01-01Subjects: “…Hot-carrier degradation…”
Get full text
Article -
3
A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling
Published 2024-01-01Subjects: Get full text
Article -
4
Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors
Published 2024-01-01Subjects: Get full text
Article -
5
Low-Temperature Deuterium Annealing for HfO₂/SiO₂ Gate Dielectric in Silicon MOSFETs
Published 2024-01-01Subjects: Get full text
Article