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Model of AlGaN/GaN based on High Electron Mobility Transistors using SILVACO ATLAS™
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2
The Effect of Channel Layer Thickness on the Performance of GaN HEMTs for RF Applications
Published 2024-12-01Subjects: Get full text
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3
New Results on the Noise Figure of HEMTs
Published 1993-01-01“…In this communication, an accurate mathematical model for the noise figure of a high electron mobility transistor is developed. This model represents a substantial improvement of the Fukui model. …”
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4
Ultrawideband LNA 1960–2019: Review
Published 2021-11-01“…Its historical aspect illustrates when the idea of wideband LNA was born and how it changed to ultrawideband LNA, and its tutorial aspect discusses circuits and achievements to present optimum LNAs in Complementary MOS (CMOS), BiCMOS and High‐Electron‐Mobility Transistor (HEMT) technologies. This work describes the endeavours of engineers in reaching UWB LNA from narrowband LNA during six decades that have great importance as a chapter in understanding this topic because it teaches all topologies, techniques, circuits and related events in a historical narrative for trained readers who are not experts on this topic.…”
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5
An Experiment and Detection Scheme for Cavity-Based Light Cold Dark Matter Particle Searches
Published 2017-01-01“…The scheme is based on our idea of a resonant detector, incorporating an integrated tunnel diode (TD) and GaAs HEMT/HFET (High-Electron Mobility Transistor/Heterogeneous FET) transistor amplifier, weakly coupled to a cavity in a strong transverse magnetic field. …”
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Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S<sub>22</sub> and h<sub>21</sub>: An Effective Machine Learning Approach
Published 2024-01-01“…The device under test (DUT) is a 0.25-<inline-formula> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula> gallium nitride (GaN) high electron mobility transistor (HEMT) on silicon carbide (SiC) substrate, which has a large gate periphery of 1.5 mm. …”
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100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications
Published 2014-01-01“…We report on high frequency (HF) and noise performances of AlSb/InAs high electron mobility transistor (HEMT) with 100 nm gate length at room temperature in low-power regime. …”
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Al‐Rich AlGaN Transistors with Regrown p‐AlGaN Gate Layers and Ohmic Contacts
Published 2025-01-01“…Abstract Epitaxial regrowth processes are presented for achieving Al‐rich aluminum gallium nitride (AlGaN) high electron mobility transistor (HEMTs) with p‐type gates with large, positive threshold voltage for enhancement mode operation and low resistance Ohmic contacts. …”
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Impact of gate metals/high-K materials and lateral scaling on the performance of AlN/GaN/AlGaN-MOSHEMT on SiC wafer for future microwave power amplifiers in RADAR & communicati...
Published 2025-03-01“…An innovative GaN-channel MOSHEMT (Metal-oxide-semiconductor-high-electron-mobility-transistor) featuring AlGaN aback barrier and AlN barrier is reported. …”
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Characterization and simulation of AlGaN barrier structure effects in normally-off recessed gate AlGaN/GaN MISHEMTs
Published 2025-01-01“…The objective of this study is to optimize the trade-off between threshold voltage (V _TH ) and maximum drain current (I _D,max ) in recessed gate AlGaN/GaN metal insulator semiconductor high electron mobility transistor (MISHEMT) using atomic layer etching (ALE) technology, with technical computer-aided design (TCAD) simulations assisting in the analysis of the underlying mechanisms to demonstrate the high performance and reliability of GaN-based power application. …”
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AlScN/GaN HEMTs with 4 A/mm on-current and maximum oscillation frequency >130 GHz
Published 2025-01-01“…Aluminum Scandium Nitride (AlScN) is an attractive material for use as a lattice-matched epitaxial barrier layer in GaN high-electron mobility transistors (HEMTs). Here we report the device fabrication, direct current (DC) and radio frequency (RF) characteristics of epitaxial AlScN/AlN/GaN HEMTs on SiC substrates with regrown ohmic contacts. …”
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Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs
Published 2024-01-01“…In this work, we investigated the instability of threshold voltage (Vth) in p-GaN/AlGaN/GaN high electron mobility transistors (HEMTs) under positive gate biases and high temperatures. …”
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A review of GaN RF devices and power amplifiers for 5G communication applications
Published 2025-01-01“…It encompasses critical issues in advanced device and circuit technology, with a focus on high frequency, high linearity, cost-effective GaN-on-Si high electron mobility transistors (HEMTs), and compact modeling. …”
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An Accurate Electrical and Thermal Co-Simulation Framework for Modeling High-Temperature DC and Pulsed I - V Characteristics of GaN HEMTs
Published 2025-01-01“…High-electron mobility transistors (HEMTs) employing AlGaN/GaN heterostructures are suitable for high-power and high-frequency applications. …”
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A Gray-Box Equivalent Neural Network Circuit Small-Signal Modeling Applied to GaN Transistors
Published 2025-01-01“…The proposed approach was applied to GaN High Electron Mobility Transistors (HEMTs) of various sizes on SiC and Diamond substrates under different bias conditions and across a wide range of frequencies. …”
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TCAD analysis of the high-temperature reverse-bias stress on AlGaN/GaN HEMTs
Published 2025-03-01“…The long-term reliability of AlGaN/GaN high electron mobility transistors (HEMTs) is a crucial factor in their widespread adoption for high-power and high-frequency applications. …”
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GaN-Based High-k Praseodymium Oxide Gate MISFETs with P2S5/(NH4)2SX + UV Interface Treatment Technology
Published 2012-01-01“…This study examines the praseodymium-oxide- (Pr2O3-) passivated AlGaN/GaN metal-insulator-semiconductor high electron mobility transistors (MIS-HEMTs) with high dielectric constant in which the AlGaN Schottky layers are treated with P2S5/(NH4)2SX + ultraviolet (UV) illumination. …”
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Stability of GaN HEMT Device Under Static and Dynamic Gate Stress
Published 2024-01-01“…In this work, we investigated the stability of a <inline-formula> <tex-math notation="LaTeX">${p}$ </tex-math></inline-formula>-GaN gate with high electron mobility transistors (HEMTs) including an internal integrated gate circuit. …”
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