Defect Detection and Error Source Tracing in Laser Marking of Silicon Wafers with Machine Learning by Hsiao-Chung Wang, Teng-To Yu, Wen-Fei Peng

Subjects: Get full text

Estimation of Dynamic Stiffness and Analysis of Error Source of Spacer Grid for Pressurized Water Reactor Fuel Assembly by ZHOU Ding1, 2, HUANG Congcai2, LI Tianyong2, QIAO Hongwei2, CUI Yihang2, ZHAO Xiangji2, MA Jianzhong2, SUN Lei2

Subjects: Get full text

High-Accuracy Bandgap Reference of <20 ppm/°C: A Review by Haoyu Zhuang, Xudong Chen, Enzhe Zhang, Qiang Li

Subjects: Get full text

SOLUTION TO EVALUATION PROBLEM OF HIDDEN SEMI-MARKOV QP-MODELS by V. M. Deundyak, M. A. Zhdanova

Subjects: “…error source model…”
Get full text

Internal validation of self-reported case numbers in hospital quality reports: preparing secondary data for health services research by Limei Ji, Max Geraedts, Werner de Cruppé

Subjects: Get full text

Satellite-derived land surface temperature spatial sharpening: A comprehensive review on current status and perspectives by Mohammad Karimi Firozjaei, Majid Kiavarz, Seyed Kazem Alavipanah

Subjects: Get full text

Why Do CMIP6 Models Fail to Simulate Snow Depth in Terms of Temporal Change and High Mountain Snow of China Skillfully? by Hongbo Zhang, Fan Zhang, Guoqing Zhang, Wei Yan

Subjects: Get full text

CONSEQUENCES FOR HEALTH AFTER THE CHERNOBYL ACCIDENT: MAIN RESULTS AND UNSOLVED PROBLEMS by A. K. Gus’kova, V. I. Krasniuk

Subjects: Get full text

Solution to error source model selection problem in IS EASECC by Vladimir M Deundyak, Maria A. Zhdanova, Nadezhda S. Mogilevskaya

Subjects: Get full text