Nanoscale monitoring of the initial stage of water condensation on a printed circuit board by Alekszej Romanenko, Ali Gharaibeh, Bálint Medgyes, Peter Petrik

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A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry by Liyuan Ma, Xipeng Xu, Changcai Cui, Mai Gao, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng

Subjects: “…spectroscopic ellipsometry…”
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Transient dielectric function dynamics driven by coherent phonons in Bismuth crystal by Boschetto Davide, Morineau Denis

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Temperature Dependence of Optical Properties of MoS₂ and WS₂ Heterostructures Assessed by Spectroscopic Ellipsometry by Hoang Tung Nguyen, Van Long Le, Thi Mai Nguyen, Xuan Khuyen Bui, Thi Giang Nguyen, Nhat Linh Nguyen, Xuan Au Nguyen, Tae Jung Kim

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