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    Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties by ZHANG Jie, ZOU Junwen, LIU Xueguang, LI Xiaoying

    Published 2024-12-01
    Subjects: “…scanning electron microscope; ion beam magnetron sputtering; non-conductive materials; surface properties; image…”
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