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    Improved printed circuit board defect detection scheme by Lufeng Bai, Wen Hao Xu

    Published 2025-01-01
    “…Furthermore, in order to further enhance the interaction and fusion of multi-scale features, we also add a SlimNeck module to the neck structure, which realizes efficient information transfer through streamlined design and reduces computational complexity at the same time. In addition, we draw on the advanced BiFPN structure, which enables the bidirectional flow of feature information between multiple layers and greatly improves the capture and integration of small target features. …”
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