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Channel Mobility and Inversion Carrier Density in MFIS FEFET: Deep Insights Into Device Physics for Non-Volatile Memory Applications
Published 2025-01-01Subjects: Get full text
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2
Charge trapping in SiO2 substrate during electron beam deposition of CaF2 thin films of different thicknesses
Published 2025-02-01Subjects: Get full text
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3
Reactions of Hydrogen-Passivated Silicon Vacancies in <i>α</i>-Quartz with Electron Holes and Hydrogen
Published 2025-01-01Subjects: Get full text
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