Showing 1 - 2 results of 2 for search '"automatic test pattern generation"', query time: 0.03s Refine Results
  1. 1
    Noise‐based logic locking scheme against signal probability skew analysis

    Noise‐based logic locking scheme against signal probability skew analysis by Ahmad Rezaei, Ali Mahani

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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  2. 2
    New scan compression approach to reduce the test data volume

    New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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