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    85Kr Thickness Gauge Source in Measuring the Areal Density of Lithium Battery Electrodes

    85Kr Thickness Gauge Source in Measuring the Areal Density of Lithium Battery Electrodes by Yunfei BAI, Binbin LIANG, Yigang PENG, Zheng GE

    Published 2025-02-01
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  2. 2
    Novel source/drain contact structure for a-IGZO devices: Oxygen-scavenger-layer metal-interlayer-semiconductor (OSL MIS) approach

    Novel source/drain contact structure for a-IGZO devices: Oxygen-scavenger-layer metal-interlayer-semiconductor (OSL MIS) approach by Sungjoo Song, Jong-Hyun Kim, Jongyoun Park, Seung-Hwan Kim, Dongjin Ko, Hyejung Choi, Seiyon Kim, Hyun-Yong Yu

    Published 2025-01-01
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