Different temperatures leakage mechanisms of (Al2O3)x(HfO2)1−x gate Dielectrics deposited by atomic layer deposition by Yifan Jia, Yi Fu, Xiangtai Liu, Zhan Wang, Pengcheng Jiang, Qin Lu, Shaoqing Wang, Yunhe Guan, Lijun Li, Haifeng Chen, Yue Hao

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Intensification of the process of equal channel angular pressing using ultrasonic vibrations by Vasily V. Rubanik, Marina S. Lomach, Vasily V. Rubanik Jr., Valery F. Lutsko, Sofya V. Gusakova

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Kinetic Aspects of Ethylene Glycol Degradation Using UV-C Activated Hydrogen Peroxide (H₂O₂/UV-C) by Timur Fazliev, Mikhail Lyulyukin, Denis Kozlov, Dmitry Selishchev

Subjects: “…H₂O₂/UV-C…”
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Effects of the Interface Properties on the Performance of UV-C Photoresistors: Gallium Oxide as Case Study by Maura Pavesi, Antonella Parisini, Pietro Calvi, Alessio Bosio, Roberto Fornari

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