Showing 1 - 3 results of 3 for search '"Testing patterns"', query time: 0.08s Refine Results
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    Noise‐based logic locking scheme against signal probability skew analysis by Ahmad Rezaei, Ali Mahani

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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    Article
  3. 3

    New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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    Article