Showing 101 - 120 results of 896 for search '"Semiconductors"', query time: 0.06s Refine Results
  1. 101

    Sensors on Flapping Wings (SOFWs) Using Complementary Metal–Oxide–Semiconductor (CMOS) MEMS Technology by Lung-Jieh Yang, Wei-Cheng Wang, Chandrashekhar Tasupalli, Balasubramanian Esakki, Mahammed Inthiyaz Shaik

    Published 2025-01-01
    “…Based on the implemented self-heating flow sensor using U18 complementary metal–oxide–semiconductor (CMOS) MEMS foundry provided by the Taiwan Semiconductor Research Institute (TSRI), the compact sensing region of the flow sensor was incorporated for in situ diagnostics of biomimetic flapping issues. …”
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    Rhodium‐Alloyed Beta Gallium Oxide Materials: New Type Ternary Ultra‐Wide Bandgap Semiconductors by Xian‐Hu Zha, Yu‐Xi Wan, Shuang Li, Dao Hua Zhang

    Published 2025-01-01
    “…Abstract Beta gallium oxide (β‐Ga2O3) is an ultra‐wide‐bandgap semiconductor with advantages for high‐power electronics. …”
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  8. 108

    Dynamics of Photoinduced Charge Carrier and Photothermal Effect in Pulse-Illuminated Narrow Gap and Moderate Doped Semiconductors by Slobodanka Galovic, Katarina Djordjevic, Milica Dragas, Dejan Milicevic, Edin Suljovrujic

    Published 2025-01-01
    “…When a sample of semiconducting material is illuminated by monochromatic light, in which the photon energy is higher than the energy gap of the semiconductor, part of the absorbed electromagnetic energy is spent on the generation of pairs of quasi-free charge carriers that are bound by Coulomb attraction. …”
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    LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns by Mehran Motamedi, Reza Shidpour, Mehdi Ezoji

    Published 2024-10-01
    “…Abstract In this paper, we present a machine learning-based approach that leverages Long Short-Term Memory (LSTM) networks combined with a sliding window technique for feature extraction, aimed at accurately predicting point defect percentages in semiconductor materials based on simulated X-ray Diffraction (XRD) data. …”
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    Comprehension of Postmetallization Annealed MOCVD-TiO2 on (NH4)2S Treated III-V Semiconductors by Ming-Kwei Lee, Chih-Feng Yen

    Published 2012-01-01
    “…The electrical characteristics of TiO2 films grown on III-V semiconductors (e.g., p-type InP and GaAs) by metal-organic chemical vapor deposition were studied. …”
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  19. 119

    A Simple Method to Differentiate between Free-Carrier Recombination and Trapping Centers in the Bandgap of the p-Type Semiconductor by Megersa Wodajo Shura

    Published 2021-01-01
    “…In this research, the ranges of the localized states in which the recombination and the trapping rates of free carriers dominate the entire transition rates of free carriers in the bandgap of the p-type semiconductor are described. Applying the Shockley–Read–Hall model to a p-type material under a low injection level, the expressions for the recombination rates, the trapping rates, and the excess carrier lifetimes (recombination and trapping) were described as functions of the localized state energies. …”
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  20. 120

    Elasto-Thermodiffusion Modeling Using Optoelectronic Microtemperature Processes for a Ramp-Type Heating Nano-Semiconductor Material by M. Adel, Khaled Lotfy, Alaa El-Bary, M. Ahmed

    Published 2024-01-01
    “…The proposed model is put to use in analyzing how ramp-type heating affects an unbounded semiconductor material plane at rest. The discussion section presents a series of graphs to analyze the effect of the main parameters.…”
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