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Surface Electric Potential Measurement with a Static Probe
Published 2023-08-01“…Surface electric potential measurements are widely used in non-destructive inspection and testing of precision surfaces, for example, in the production of semiconductor devices and integrated circuits. Features of the construction and application of devices for measuring the surface electric potential using an immovable reference electrode are considered. …”
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Design and Analysis of a New High Step-Up Converter Using Switched-Inductor-Capacitor Voltage Multiplier Cells for Photovoltaic Application
Published 2024-01-01“…Also, the mathematical expressions for the design of inductors, capacitors, voltage and current stress of semiconductor devices are provided. The proposed converter is simulated in MATLAB-Simulink and validated the effectiveness of the performance using a laboratory-based Prototype of 250 W at 50 kHz with a 60% duty cycle. …”
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Global Existence and Large Time Behavior of Solutions to the Bipolar Nonisentropic Euler-Poisson Equations
Published 2014-01-01“…We study the one-dimensional bipolar nonisentropic Euler-Poisson equations which can model various physical phenomena, such as the propagation of electron and hole in submicron semiconductor devices, the propagation of positive ion and negative ion in plasmas, and the biological transport of ions for channel proteins. …”
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Improving radiation tolerance with room temperature annealing of pre-existing defects
Published 2025-01-01“…Pre-existing defects in semiconductor devices can act as nucleation sites for radiation damage. …”
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Optical and Morphological Studies of Thermally Evaporated PTCDI-C8 Thin Films for Organic Solar Cell Applications
Published 2013-01-01“…PTCDI-C8 due to its relatively high photosensitivity and high electron mobility has attracted much attention in organic semiconductor devices. In this work, thin films of PTCDI-C8 with different thicknesses were deposited on silicon substrates with native silicon dioxide using a vacuum thermal evaporator. …”
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A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)
Published 2025-01-01“…The semiconductor industry plays a vital role in modern technology, with semiconductor devices embedded in almost all electronic products. …”
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Enhanced high-energy proton radiation hardness of ZnO thin-film transistors with a passivation layer
Published 2025-01-01“…These results highlight the potential of passivated metal-oxide thin films for developing reliable radiation-hardened semiconductor devices that can be used in harsh space environments. …”
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A fault‐diagnosis and tolerant control technique for five‐level cascaded H‐bridge inverters
Published 2021-07-01“…The consequences of faults increase as the number of power semiconductor devices increases and may lead to serious damage to the overall system. …”
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The application of organic materials used in IC advanced packaging:A review
Published 2025-04-01“…To meet the increasing complexity and performance requirements of semiconductor devices, many integrated circuit (IC) advanced packaging technologies have been developed, which including flip chip (FC), bumping, fan-in wafer level packaging (FIWLP), fan-out wafer level packaging (FOWLP), 2.5D packaging (interposer), CMOS image sensor through silicon via (CIS-TSV), fan-out panel level packaging (FOPLP) and so on. …”
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Design of Analog Signal Processing Applications Using Carbon Nanotube Field Effect Transistor-Based Low-Power Folded Cascode Operational Amplifier
Published 2018-01-01“…Carbon nanotube (CNT) is one of the embryonic technologies within recent inventions towards miniaturization of semiconductor devices and is gaining much attention due to very high throughput and very extensive series of applications in various analog/mixed signal applications of today’s high-speed era. …”
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Optimized Control for MMCs with Reduced Power Loss and Extended Lifetime
Published 2024-01-01“…Compared with the conventional power loss optimization control, the proposed control could decrease the maximal power consumption of the semiconductor devices without increasing the total loss of the SM. …”
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A Process Optimization Method of the Mini-LOCOS Field Plate Profile for Improving Electrical Characteristics of LDMOS Device
Published 2023-01-01“…Finally, the optimized laterally diffused metal oxide semiconductor devices have been fabricated, and both figure of merit curves and safe operation area curves are measured. …”
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Memristor-based feature learning for pattern classification
Published 2025-01-01“…However, since biological organs may operate differently from semiconductor devices, deep models usually require dedicated hardware and are computation-complex. …”
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Technology and Modeling of Nonclassical Transistor Devices
Published 2019-01-01“…As technology goes into the nanometer regime, semiconductor devices are confronting numerous short-channel effects. …”
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Device Modeling Based on Cost-Sensitive Densely Connected Deep Neural Networks
Published 2024-01-01“…Engineers used TCAD tools for semiconductor devices modeling. However, it is computationally expensive and time-consuming for advanced devices with smaller dimensions. …”
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Stability Improvement of an Efficient Graphene Nanoribbon Field-Effect Transistor-Based SRAM Design
Published 2020-01-01“…The development of the nanoelectronics semiconductor devices leads to the shrinking of transistors channel into nanometer dimension. …”
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Low Thermal Resistance of Diamond‐AlGaN Interfaces Achieved Using Carbide Interlayers
Published 2025-02-01“…This study provides a foundation for future research in improving thermal properties of semiconductor devices through interface engineering and advanced measurement methodologies.…”
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