Showing 1 - 20 results of 220 for search '"Metrology"', query time: 0.05s Refine Results
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    Metrology of metasurfaces: optical properties by Nicolas Kossowski, Yanel Tahmi, Amir Loucif, Martin Lepers, Benoit Wattellier, Guillaume Vienne, Samira Khadir, Patrice Genevet

    Published 2025-01-01
    “…Here, we first review the existing optical metrology techniques previously used for metasurface inspection, including intensity, polarization, quantitative phase measurements, and ptychographic imaging. …”
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    METROLOGICAL PERFORMANCES OF BOMB CALORIMETERS AT REAL CONDITIONS by Yu. V. Maksimuk, Z. A. Antonava, V. S. Krouk, V. V. Fes’ko, V. N. Kursevich, A. F. Syshchanka, I. V. Vasarenko

    Published 2016-06-01
    “…In this work influence room temperature (Тк) and heat exchange conditions on metrological characteristics of two models of calorimeters is considered with different degree of thermal protection: V-08МА and BIC 100. …”
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    Metrological Advantages in Seeded and Lossy Nonlinear Interferometers by Jasper Kranias, Guillaume Thekkadath, Khabat Heshami, Aaron Z. Goldberg

    Published 2025-02-01
    “…We normalize the results based on the number of photons going through the sample that induces a phase shift on the incident quantum state, which eliminates some of the previously declared metrological advantages. We analyze the performance of nonlinear interferometers in a variety of geometries and robustness of the quantum advantage with respect to internal and external loss through direct comparison with a linear interferometer. …”
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    METROLOGICAL PERFORMANCE MODELING OF PROBE ELECTROMETERS CAPACITIVE SENSORS by A. K. Tyavlovsky, O. K. Gusev, A. L. Zharin

    Published 2015-04-01
    “…The obtained expression allows analyzing metrological characteristics of the circuit containing the dynamic capacitor at any values of its parameters. …”
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    Impact of JPEG compression on the metrological characteristics of industrial CT data by Steffen Kieß, Robin Trostorf, Hieu Tran, Jajnabalkya Guhathakurta, Sven Simon, Ulrich Neuschaefer-Rube

    Published 2025-02-01
    “… The basis of metrology with computed tomography (CT) are volume datasets with increasing sizes in the two- or three-digit GB range due to the increasing detector resolutions in the double-digit MPixel range. …”
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    Metrological studies of the characteristics of multilayer surface coatings using synchrotron radiation by A. S. Sigov, O. A. Minaeva, S. I. Anevsky, A. M. Lebedev, R. V. Minaev

    Published 2021-03-01
    “…It plays an important role in nanoelectronics metrological base. The main research were carried out at electron storage rings «Siberia-1» (Kurchatov Institute) and MLS (PTB, Berlin) with low electron energy, in a wide wavelength range, including visible range, AUV, VU, EUV and to exclude the X-ray radiation influence. …”
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    METROLOGICAL SUPPORT OF DOSIMETRY GAMMA-RAY WITH ENERGY TO 10 MEV FOR RADIATION PROTECTION DEVICES by D. I. Komar, R. V. Lukashevich, V. D. Guzov, S. A. Kutsen

    Published 2017-09-01
    “…We determined the geometric dimensions of the uniform field and the interval of operating distances of the facility.We investigated the metrological characteristics of capture gamma-ray fields from titanium target and nickel target obtained at the AT140 Neutron Calibration Facility for dosimetric radiation protection devices. …”
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    Concentration of traffic air pollutants and influencing metrological factors in Hawassa City roadways, Ethiopia by Asmare Asrat Yirdaw, Amanuel Ejeso, Samrawit Mokie Belayneh, Lamrot Yohannes, Anmut Endalkachew Bezie, Embialle Mengistie Beyene

    Published 2025-01-01
    “…Likewise, stepwise multiple linear regression analysis confirms that the concentrations of traffic air pollutants had a positive relationship with metrological parameters.ImplicationsThe findings of this study therefore showed the need for regular air quality monitoring of the urban areas to copping out the adverse public health impacts. …”
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