Showing 101 - 120 results of 220 for search '"Metrology"', query time: 0.05s Refine Results
  1. 101

    From mega to nano, a round trip. The process/project of protection, preservation and restoration of Cultural Heritage by Stefano Francesco Musso

    Published 2020-06-01
    “…The terms ‘mega’ and ‘nano’ proposed by Agathón issue number 7 are linked, primarily, to the scientific field and in particular to metrology, but are often found also in common, figurative or metaphorical language. …”
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    THE RISK-ORIENTED APPROACH TO THE DEVELOPMENT OF CONTROL METHOD by P. S. Serenkov, V. L. Hurevich, M. R. Movlamov, A. S. Yetumya

    Published 2018-06-01
    “…Formulated and solved the task of the metrological control of the thickness of the flame-retardant coating as indirect measurement methods non-destructive thickness measurements. …”
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    La Cartopartie, une nouvelle forme de balade urbaine déployée par les villes by Gwendoline l’Her, Myriam Servières, Daniel Siret

    Published 2018-12-01
    “…This workshop, initiated by OpenStreetMap’s community, is currently appropriated by local authorities to include this kind of urban walks in citizen participation dispositifs using digital technologies : citizen metrology on urban air quality, on sound environment, remarkable trees inventory, corner urban services mapping. …”
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  13. 113

    Damage Characterization of Polypropylene Honeycomb Sandwich Panels Subjected to Low-Velocity Impact by Freeda A. Amir, A. R. Othman, H. Md. Akil

    Published 2013-01-01
    “…The degree of the postimpact damages of the sandwich is further characterized using an optical surfaces metrology analysis. The thickness of the honeycomb was found to influence the extent of the damage which occurred following the low-velocity impact. …”
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    Effects of Strain Rates on Kinetics of Elements of Repeated Pattern Structures: A Continuous Modeling Approach by A. Salehian

    Published 2012-01-01
    “…Space inflatable technology is a promising solution to placing large metrology systems in space. Lighter weight, higher packaging efficiency, and easier maintenance are among a few of their advantages over mechanically deployed structures. …”
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    Perspective on the development of XPS and the pioneers who made it possible by D. R. Baer, P. M. A. Sherwood

    Published 2025-01-01
    “…Included is information about the early development of photoelectron spectroscopy, the seminal work of Kai Siegbahn, influential conferences that helped spread excitement and provide a fundamental understanding of the method, early development of commercial instruments, and identification of the need for systematic metrology. Because hundreds of researchers have contributed to advancing the method, we note that this is our perspective, with likely a different emphasis than others may have chosen. …”
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    EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

    Published 2015-03-01
    “…Complex  SPM  200  realizes  nondestructive control of microelectronics elements made on silicon wafers up to 200 mm in diameter and it is introduced by JSC «Integral» for the purpose of operational control, metrology and acceptance of the final product.…”
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