Showing 1 - 3 results of 3 for search '"Frontiers in Electronic Materials"', query time: 0.05s Refine Results
  1. 1
    Excitonic insulator candidate Ta2NiSe5 and related transition-metal compounds studied by resonant inelastic x-ray scattering

    Excitonic insulator candidate Ta2NiSe5 and related transition-metal compounds studied by resonant inelastic x-ray scattering by Takashi Mizokawa, Claude Monney

    Published 2025-02-01
    “…Frontiers in Electronic Materials…”
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  2. 2
    Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes

    Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes by M. F. DiScala, V. Hsieh, B. S. Jessen, Y. Gu, D. J. Rizzo, J. M. Amontree, X. Yan, Q. Wang, M. Kapfer, T. Kim, M. Geiwitz, G. Natale, J. Pelliciari, J. C. Hone, K. S. Burch, D. N. Basov, C. R. Dean, V. Bisogni, K. W. Plumb

    Published 2025-06-01
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  3. 3
    2DEG properties of AlScN/GaN and AlYN/GaN HEMTs determined by terahertz optical Hall effect

    2DEG properties of AlScN/GaN and AlYN/GaN HEMTs determined by terahertz optical Hall effect by V. Stanishev, V. Stanishev, I. Streicher, I. Streicher, A. Papamichail, V. Rindert, P. P. Paskov, S. Leone, V. Darakchieva, V. Darakchieva

    Published 2025-07-01
    “…Frontiers in Electronic Materials…”
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