Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co by A.T. Morchenko, L.V. Panina, V.G. Kostishyn, N.A. Yudanov, S.P. Kurochka, A.A. Sergienko, R.D. Piliposyan, N.N. Krupa

Subjects: “…Magneto-ellipsometry…”
Get full text

Investigating the polarized emission of P3HT films and the role of GO in the interfacial layer by Aleffe Bruno Schura, Ana Clarissa H. Kolbow, Everton Crestani Rambo, Gustavo Gonçalves Dalkiranis, Cássio Araújo do Nascimento, Romildo Jerônimo Ramos, Alexandre Marletta, Luiz Pereira, José Carlos Germino, Eralci Moreira Therézio

Subjects: “…Emission ellipsometry…”
Get full text

The influence of shot noise on the performance of phase singularity-based refractometric sensors by Maslova Valeria, Ermolaev Georgy, Andrianov Evgeny S., Arsenin Aleksey V., Volkov Valentyn S., Baranov Denis G.

Subjects: Get full text

Investigation of the optical and electrical properties of zinc oxide by terahertz time domain ellipsometry by Zixi Zhao, Verdad C. Agulto, Toshiyuki Iwamoto, Kosaku Kato, Kohei Yamanoi, Toshihiko Shimizu, Nobuhiko Sarukura, Takashi Fujii, Tsuguo Fukuda, Masashi Yoshimura, Makoto Nakajima

Subjects: Get full text

Ellipsometric Studies on Silver Telluride Thin Films by M. Pandiaraman, N. Soundararajan, C. Kumar, R. Ganesan

Subjects: “…Ellipsometry…”
Get full text

Advancing perovskite solar cells: Optical characterization and performance enhancement via spectroscopic ellipsometry by Eri Widianto, Bhisma Mahendra, Muhammad Riswan, Frendy Jaya Kusuma, Kardiman, Eka Nurfani, Indra Pardede, Natalita Maulani Nursam, Kuwat Triyana, Iman Santoso

Subjects: Get full text

Ordered arrays of metal nanostructures on insulator/metal film: dependence of plasmonic properties on lattice orientation by Eugene Bortchagovsky, Fang Dai, Jia Tang, Ralfy Kenaz, Ilya Milekhin, Yurii Demydenko, Alla Bogoslovska, Pierre-Michel Adam, Ronen Rapaport, Monika Fleischer, Dietrich R T Zahn

Subjects: Get full text

Reflectivity from electrochemically protected Nb surfaces by Irena Mickova

Subjects: Get full text

Fast Detection of Uric Acid in Urine for Early Diagnosis Using THz Polarized Waves by Zahra Mazaheri, Giorgia Federico, Can Koral, Gian Paolo Papari, Lakshmi Ullatil, Paolo Russo, Antonello Andreone

Subjects: Get full text

Effective Impedance Method for In situ Ellipsometry Analysis of Magnetic Films by L.V. Panina, A.T. Morchenko, L.V. Kozhitov, P.A. Ryapolov

Subjects: “…In situ ellipsometry…”
Get full text

Circularly Polarized Light From a Series of Chiral Fluorene Copolymers by Luiz F. R. B. Toledo, Denis Augusto Turchetti, Cristiano Zanlorenzi, Ana Paula Glislere, Bruno Nowacki, Alexandre Marletta, Edemir L. Kowalski, Leni Campos Akcelrud

Subjects: Get full text

Optical Calibration of a Multi-Color Ellipsometric Mapping Tool Fabricated Using Cheap Parts by Berhane Nugusse Zereay, Sándor Kálvin, György Juhász, Csaba Major, Péter Petrik, Zoltán György Horváth, Miklós Fried

Subjects: “…ellipsometry…”
Get full text

Nanoscale monitoring of the initial stage of water condensation on a printed circuit board by Alekszej Romanenko, Ali Gharaibeh, Bálint Medgyes, Peter Petrik

Subjects: Get full text

Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation by Vukoman Jokanović, Nenad Bundaleski, Božana Čolović, Manuela Ferarra, Bojan Jokanović, Ilija Nasov

Subjects: Get full text

Multiangular and Spectral Ellipsometry for Semiconductor Nanostructures Classification by A.A. Goloborodko, M.V. Epov, L.Y. Robur, T.V. Rodionova

Subjects: Get full text

In-situ monitoring of tungsten oxides reduction during deuterium plasma exposure by spectroscopic ellipsometry by F. Pappalardo, L. Rayneau, C. Martin, M. Cabie, E. Salomon, T. Angot, G. Cartry, R. Bisson, M. Minissale

Subjects: Get full text

Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films by Xiaojie Sun, Qingyuan Cai, Jiao Qi, Baojian Liu, Yuxiang Zheng, Rongjun Zhang, Jing Li, Songyou Wang, Liangyao Chen, Youngpak Lee

Subjects: Get full text

A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry by Liyuan Ma, Xipeng Xu, Changcai Cui, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng

Subjects: Get full text

Software and Hardware System for the Investigation of the Thin Film Optical Properties by O.V. Fedchenko, K.V. Tyschenko, S.I. Protsenko, M.G. Demydenko

Subjects: “…Null-ellipsometry…”
Get full text

Temperature-induced evolutions in critical point optical transitions in HfS2 investigated by spectroscopic ellipsometry by Qihang Zhang, Honggang Gu, Zhengfeng Guo, Shiyuan Liu

Subjects: Get full text