A diffractometer project for Brazilian Multipurpose Reactor (RMB): McStas simulations and instrument optimization by Alexandre Pinho dos Santos Souza, Luiz Paulo de Oliveira, Fabiano Yokaichiya, Frederico Antonio Genezini, Margareth Kazuyo Kobayashi Dias Franco

Subjects: “…diffractometer…”
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Effect of Substrates Types on CO Gas Sensing of SnO2 Thin Film Prepared by Sol-Gel Method by Sumanta Kumar Tripathy, Bhabani Prasad Hota, V. Siva Jahnavy

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Multievent Correlation with Neutron Volume Detectors by Noah Nachtigall, Andreas Houben, Richard Dronskowski

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Simulating Araponga - The High-Resolution Diffractometer of Brazilian Multipurpose Reactor by Alexandre Pinho dos Santos Souza, Luiz Paulo de Oliveira, Frederico Antonio Genezini, Adimir dos Santos

Subjects: “…brazilian multipurpose reactor, monte carlo simulations, high-resolution diffractometer…”
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Enhancing PEEK bond strength: the impact of chemical and mechanical surface modifications on surface characteristics and phase transformation by Emel Arslan, Ipek Caglar

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Evaluating the reusability of carbon black recovered from waste tyres: An elemental and microstructural analysis by Olusola Olayemi Fadipe, Kehinde Adenike Oyewole, Abiola Usman Adebanjo, Ayotunde Taiwo Ajiferuke, Olakunle Olukayode

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Laboratory-based X-ray diffractometer with fast time resolution for operando battery studies by Zhenzhong Li, Chao Wang, Fanqiang Meng, Zhou Zhou, Lei Li, Chunzhen Yang, Dongbai Sun

Subjects: “…x-ray diffractometer…”
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N2+-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films by Usha Rani, Kafi Devi, Divya Gupta, Sanjeev Aggarwal

Subjects: “…grazing angle x-ray diffractometer…”
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Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering by Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi

Subjects: “…x-ray diffractometers…”
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