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    Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes

    Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes by Samuel Parent, Frederic Vachon, Valerie Gauthier, Steve Lamoureux, Alexandre Paquette, Jacob Deschamps, Tommy Rossignol, Nicolas Roy, Philippe Arsenault, Henri Dautet, Serge A. Charlebois, Jean-Francois Pratte

    Published 2024-01-01
    Subjects: “…Active probe card…”
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