Showing 181 - 200 results of 262 for search '"APEC"', query time: 0.03s Refine Results
  1. 181
    A Simulative Approach to Electron Conduction in Thick-Film Resistors

    A Simulative Approach to Electron Conduction in Thick-Film Resistors by A. Rizzi, M. Prudenziati, C. Jacoboni

    Published 1983-01-01
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  2. 182
    Chemical Reaction and Electrical Properties of Amorphous RuO2-Ag-Glass Ternary System

    Chemical Reaction and Electrical Properties of Amorphous RuO2-Ag-Glass Ternary System by Kiichi Shinriki, Akira Ikegami

    Published 1978-01-01
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  3. 183
    A Practically Realizable Model of a Uniformly Distributed R-C Network (URC¯)

    A Practically Realizable Model of a Uniformly Distributed R-C Network (URC¯) by U. Kumar

    Published 1981-01-01
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  4. 184
    Application-Oriented Description of the Quality of Electronic Components (ppm Concept)

    Application-Oriented Description of the Quality of Electronic Components (ppm Concept) by Wolfgang Junghans

    Published 1981-01-01
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  5. 185
    Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index

    Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index by Minoru Tanaka, Susumu Kasukabe

    Published 1981-01-01
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  6. 186
    Anodic Oxidation of Porous Aluminium Pellets

    Anodic Oxidation of Porous Aluminium Pellets by E. J. Fresia, W. J. Bernard

    Published 1974-01-01
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  7. 187
    Resistor Geometry Comparison With Respect to Current Noise and Trim Sensitivity

    Resistor Geometry Comparison With Respect to Current Noise and Trim Sensitivity by W. Ulbrich

    Published 1977-01-01
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  8. 188
    Mounting of Micropackages in Vapour Phase Soldering and Study of Ageing Mechanism

    Mounting of Micropackages in Vapour Phase Soldering and Study of Ageing Mechanism by Jacques D. Agniel, Christian M. Val

    Published 1983-01-01
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  9. 189
    Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient

    Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient by C. R. Tellier, A. J. Tosser, C. R. Pichard

    Published 1981-01-01
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  10. 190
    Photoluminescence of Anodic Oxide Films on Aluminium

    Photoluminescence of Anodic Oxide Films on Aluminium by Issei Mizuki, Kenichi Shimizu, Nobuyoshi Baba, Sakae Tajima

    Published 1976-01-01
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  11. 191
    Temperature-stable Barium Titanate Ceramics Containing Niobium Pentoxide

    Temperature-stable Barium Titanate Ceramics Containing Niobium Pentoxide by Ian Burn

    Published 1976-01-01
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  12. 192
    An Air Firing Base Metal Resistor and Conductor System for Low Cost Thick Film Circuit Manufacture

    An Air Firing Base Metal Resistor and Conductor System for Low Cost Thick Film Circuit Manufacture by B. Walton, E. K. Browne

    Published 1981-01-01
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  13. 193
    Current Noise of Resin Type and Cermet Type Thick Film Resistors

    Current Noise of Resin Type and Cermet Type Thick Film Resistors by Tien-Shou Wu, Toyotaro Shiramatsu, Shen-Li Fu

    Published 1980-01-01
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  14. 194
    Examination of Thick-Films Using Modern Surface Analytical Techniques

    Examination of Thick-Films Using Modern Surface Analytical Techniques by G. Ripka, G. Harsányi

    Published 1984-01-01
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  15. 195
    UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films

    UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films by Günther Menzel, Alfred Schäfer

    Published 1977-01-01
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  16. 196
    Allowable Power in NiCr Film Resistors

    Allowable Power in NiCr Film Resistors by E. Prociów, T. Berlicki

    Published 1982-01-01
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  17. 197
    Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance

    Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance by C. Balasubramanian, M. Radhakrishnan, K. Narayandas

    Published 1982-01-01
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  18. 198
    Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

    Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates by C. Thebault, R. Schnitzler, J. P. Ramy

    Published 1983-01-01
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  19. 199
    The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components

    The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components by P. Trägner

    Published 1984-01-01
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  20. 200
    An X-Ray Technique for Evaluating the Structure of Films for Device Applications

    An X-Ray Technique for Evaluating the Structure of Films for Device Applications by Ian N. Court, R. N. Clarke

    Published 1978-01-01
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