Showing 261 - 280 results of 521 for search '"Приборы и методы измерений"', query time: 0.08s Refine Results
  1. 261
    THE PROCEDURE AND HARDWARE OF A PREPARATION MOVEMENT TRAJECTORY DEFINITION AND TIME AND FREQUENCY PARAMETERS OF ITS INTERACTION WITH A SAWING DISK AT THE MESSAGE TO IT OF TWO-DIMENSIONAL PERIODIC CIRCULATING MOVEMENT

    THE PROCEDURE AND HARDWARE OF A PREPARATION MOVEMENT TRAJECTORY DEFINITION AND TIME AND FREQUENCY PARAMETERS OF ITS INTERACTION WITH A SAWING DISK AT THE MESSAGE TO IT OF TWO-DIMEN... by M. G. Kiselev, A. V. Drozdov, D. A. Yamnaja

    Published 2015-04-01
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  2. 262
    RESEARCH OF DIGITAL CAMERA DYNAMIC RANGE ON THE IMAGING PROCESSING BASIS

    RESEARCH OF DIGITAL CAMERA DYNAMIC RANGE ON THE IMAGING PROCESSING BASIS by M Sutkowski, Ya. N. Saukova

    Published 2017-09-01
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  3. 263
    LABORATORY SETTING FOR TESTS OF STANDARDS ON TIREDNESS BY MEANS OF BIHARMONIC LADENING

    LABORATORY SETTING FOR TESTS OF STANDARDS ON TIREDNESS BY MEANS OF BIHARMONIC LADENING by V. N. Busko

    Published 2015-12-01
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  4. 264
    Application of Multivariate Analysis of Broadband Transmission Spectra for Calibration of Physico-Chemical Parameters of Wines

    Application of Multivariate Analysis of Broadband Transmission Spectra for Calibration of Physico-Chemical Parameters of Wines by M. A. Khodasevich, E. A. Scorbanov, M. V. Rogovaya

    Published 2019-06-01
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  5. 265
    Compositionally Disordered Doped with Cerium Crystalline Garnet Type Materials for Brighter and Faster Scintillations

    Compositionally Disordered Doped with Cerium Crystalline Garnet Type Materials for Brighter and Faster Scintillations by M. V. Korzhik

    Published 2021-12-01
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  6. 266
    Diffuse Reflectance Spectrophotometers Based on C12880MA and C11708MA Mini-Spectrometers Hamamatsu

    Diffuse Reflectance Spectrophotometers Based on C12880MA and C11708MA Mini-Spectrometers Hamamatsu by V. A. Firago, N. V. Levkovich, K. I. Shuliko

    Published 2022-07-01
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  7. 267
    Structural Solutions that Increase the Dynamic Accuracy of a Wave Solid-State Gyroscope

    Structural Solutions that Increase the Dynamic Accuracy of a Wave Solid-State Gyroscope by D. M. Malyutin

    Published 2021-06-01
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  8. 268
    Temperature Measuring Method Accuracy Evaluation in the Microarc Heating Process Based on Reproducibility and Uncertainty Indicators

    Temperature Measuring Method Accuracy Evaluation in the Microarc Heating Process Based on Reproducibility and Uncertainty Indicators by M. S. Stepanov, I. G. Koshlyakova

    Published 2024-04-01
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  9. 269
    CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS

    CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS by V. А. Pilipenko, V. A. Saladukha, V. A. Filipenya, R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. V. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

    Published 2017-12-01
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  10. 270
    METROLOGICAL MAINTENANCE OF SIMULATORS WITH MANY AMOUNTS OF FREEDOM

    METROLOGICAL MAINTENANCE OF SIMULATORS WITH MANY AMOUNTS OF FREEDOM by N. B. Sotsky

    Published 2015-03-01
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  11. 271
    MEASURING DEVICES OF 3-MM WAVE-LENGTH RANGE

    MEASURING DEVICES OF 3-MM WAVE-LENGTH RANGE by V. V. Murav’iov, S. A. Korenevsky, N. M. Naumovich

    Published 2015-04-01
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  12. 272
    Control of Integrated Circuits Crystals' Surface Microrelief and Defects of Heteroand Submicrostructures by the Atomic Force Microscopy Method

    Control of Integrated Circuits Crystals' Surface Microrelief and Defects of Heteroand Submicrostructures by the Atomic Force Microscopy Method by V. A. Lapitskaya, S. A. Chizhik, E. V. Lutsenko, J. A. Solovjov, A. A. Nasevich, K. S. Liutsko, T. V. Petlitskaya, V. B. Makarevich, Yu. Guangbin

    Published 2024-12-01
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  13. 273
    TESTING AND QUALITY ASSURANCE OF SOFTWARE AND HARDWARE SYSTEMS BASED ON USE OF VIRTUAL TECHNOLOGICAL OBJECTS

    TESTING AND QUALITY ASSURANCE OF SOFTWARE AND HARDWARE SYSTEMS BASED ON USE OF VIRTUAL TECHNOLOGICAL OBJECTS by A. S. Brakarenka

    Published 2015-03-01
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  14. 274
    PHOTOEMISSION METHOD OF TEMPERATURE MEASURING IN THE PROCESS OF SPARK PLASMA SINTERING POWDERS OF REFRACTORY METALS

    PHOTOEMISSION METHOD OF TEMPERATURE MEASURING IN THE PROCESS OF SPARK PLASMA SINTERING POWDERS OF REFRACTORY METALS by D. V. Minko, O. O. Kuznechik

    Published 2015-04-01
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  15. 275
    Gas-Sensitive Characteristics of Low-Power Semiconductor Gas Sensors to CO and H<sub>2</sub>

    Gas-Sensitive Characteristics of Low-Power Semiconductor Gas Sensors to CO and H<sub>2</sub> by I. A. Taratyn, O. G. Reutskaya, G. G. Gorokh, I. V. Serdyuk, V. S. Fedosenko

    Published 2024-04-01
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  16. 276
    ILLUMINANCE MEASUREMENT IN THE RANGE FROM 0,001 TO 1,000 LX

    ILLUMINANCE MEASUREMENT IN THE RANGE FROM 0,001 TO 1,000 LX by V. A. Dlugunovich, S. A. Nikanenka, O. B. Tarasova

    Published 2015-03-01
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  17. 277
    METROLOGICAL PROVISION FOR MEASUREMENTS OF CALORIFIC VALUE OF SOLID AND LIQUID FUELS

    METROLOGICAL PROVISION FOR MEASUREMENTS OF CALORIFIC VALUE OF SOLID AND LIQUID FUELS by Yu. V. Maksimuk, V. V. Fes’ko, I. V. Vasarenko, V. G. Dubovik

    Published 2015-03-01
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  18. 278
    A GAUGE FOR MEASUREMENTS OF THERMAL COEFFICIENT OF THE OPTICAL PATH IN LASER MATERIALS

    A GAUGE FOR MEASUREMENTS OF THERMAL COEFFICIENT OF THE OPTICAL PATH IN LASER MATERIALS by P. A. Loiko, A. M. Malyarevich, K. V. Yumashev

    Published 2015-03-01
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  19. 279
    METHODS FOR INCREASING THE EFFICIENCY OF A DUAL-CHANNEL OPTO-ELECTRONIC SIGHT

    METHODS FOR INCREASING THE EFFICIENCY OF A DUAL-CHANNEL OPTO-ELECTRONIC SIGHT by R. V. Fiodortсev, A. P. Shkadarevich, Qusai Eid Mohammad, A. V. Fufaev

    Published 2018-06-01
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  20. 280
    Control of Tribological Characteristics of Wear-Resistant AlCrBN Coatings by Nanoscratch Testing

    Control of Tribological Characteristics of Wear-Resistant AlCrBN Coatings by Nanoscratch Testing by V. A. Lapitskaya, T. A. Kuznetsova, B. Warcholinski, A. V. Khabarova, T. V. Hamzeleva, A. Gilewicz, S. A. Chizhik

    Published 2025-07-01
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