Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model
A study of the electrostatic force between an Electrostatic Force Microscope tip and a dielectric thin film with finite conductivity is presented. By using the Thomas-Fermi approximation and the method of image charges, we calculate the electrostatic potential and force as a function of the thin fil...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2015-01-01
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| Series: | Advances in Condensed Matter Physics |
| Online Access: | http://dx.doi.org/10.1155/2015/754098 |
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