Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack
Modified variant of the method Cox-Strack, which allows to reduce an amount of frontal contacts on the test sample before 2 and simultaneously exclude an operation of the extrapolation of schedules at the determination of the specific contact resistance ρК, is considered. There is shown that con...
Saved in:
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
2018-09-01
|
| Series: | Омский научный вестник |
| Subjects: | |
| Online Access: | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/4%20(160)/119-123%20%D0%91%D1%83%D1%80%D0%BB%D0%B0%D0%BA%D0%BE%D0%B2%20%D0%A0.%20%D0%91..pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|