Ju, I. H., & Kim, H. K. Elastic Shifts: I/O Sequence Patterns of Ransomware and Detection Evasion. IEEE.
Chicago Style (17th ed.) CitationJu, Il Hyeon, and Huy Kang Kim. Elastic Shifts: I/O Sequence Patterns of Ransomware and Detection Evasion. IEEE.
MLA (9th ed.) CitationJu, Il Hyeon, and Huy Kang Kim. Elastic Shifts: I/O Sequence Patterns of Ransomware and Detection Evasion. IEEE.
Warning: These citations may not always be 100% accurate.