APA (7th ed.) Citation

Chen, H., Pan, J., Wang, S., Li, L., Huang, J., Chen, S., & Liu, H. Explicit Function Model of Electromagnetic Reliability for CMOS Inverters Under HPM Coupling Based on Physical Mechanism Analysis and Neural Network Algorithm. IEEE.

Chicago Style (17th ed.) Citation

Chen, Huikai, Jinbin Pan, Shulong Wang, Liutao Li, Jin Huang, Shupeng Chen, and Hongxia Liu. Explicit Function Model of Electromagnetic Reliability for CMOS Inverters Under HPM Coupling Based on Physical Mechanism Analysis and Neural Network Algorithm. IEEE.

MLA (9th ed.) Citation

Chen, Huikai, et al. Explicit Function Model of Electromagnetic Reliability for CMOS Inverters Under HPM Coupling Based on Physical Mechanism Analysis and Neural Network Algorithm. IEEE.