FAN Jiawei, W. L. Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO. China Food Publishing Company.
Chicago Style (17th ed.) CitationFAN Jiawei, WU Lan. Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO. China Food Publishing Company.
MLA (9th ed.) CitationFAN Jiawei, WU Lan. Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO. China Food Publishing Company.
Warning: These citations may not always be 100% accurate.