Study on Microwave Dielectric Materials an Adjustable Temperature Drift Coefficient and a High Dielectric Constant

This paper reports the dielectric characterizations of (Ca<sub>0.95</sub>Sr<sub>0.05</sub>)(Ti<sub>1−x</sub>Sn<sub>x</sub>)O<sub>3</sub> ceramics prepared using a solid-state reaction method with various x values. X-ray diffraction spectros...

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Bibliographic Details
Main Authors: Yuan-Bin Chen, Yu Fan, Shiuan-Ho Chang, Shaobing Shen
Format: Article
Language:English
Published: MDPI AG 2024-09-01
Series:Ceramics
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Online Access:https://www.mdpi.com/2571-6131/7/3/81
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Summary:This paper reports the dielectric characterizations of (Ca<sub>0.95</sub>Sr<sub>0.05</sub>)(Ti<sub>1−x</sub>Sn<sub>x</sub>)O<sub>3</sub> ceramics prepared using a solid-state reaction method with various x values. X-ray diffraction spectroscopy analyses showed that the crystal structure of these pure samples was orthorhombic perovskite. With increasing Sn<sup>4+</sup> content, the lattice constant and unit cell volume increased, while the dielectric constant decreased because of the ionic polarizability decreasing. Moreover, a maximum Q × f value of 5242 (GHz), a dielectric constant (ε<sub>r</sub>) of 91.23, and a temperature coefficient (τ<sub>f</sub>) of +810 ppm/°C were achieved for samples sintered at 1350 °C for 4 h. The microwave dielectric characterization was found to be strongly correlated with the sintering temperature, and the best performance was achieved for the sample sintered at 1350 °C. (Ca<sub>0.95</sub>Sr<sub>0.05</sub>)(Ti<sub>1−x</sub>Sn<sub>x</sub>)O<sub>3</sub> possesses a promising potential to be a τ<sub>f</sub> compensator for a near-zero τ<sub>f</sub> dielectric ceramic applied in wireless communication systems.
ISSN:2571-6131