Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper)
Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution and mixed Weibull distributions. The methods used for anal...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1987-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1987/23687 |
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