Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells
The band gap, grain size, and topography of a Cu(In,Ga)Se2 (CIGSe) thin film solar cell are analyzed using surface photovoltage spectroscopy (SPV) and atomic force microscopy (AFM) techniques. From the steep increase in SPV signal the band gap of the CIGSe absorber, In2S3 and ZnO layers are extracte...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2015-01-01
|
| Series: | International Journal of Photoenergy |
| Online Access: | http://dx.doi.org/10.1155/2015/829530 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1832560290247475200 |
|---|---|
| author | Nima E. Gorji Ugo Reggiani Leonardo Sandrolini |
| author_facet | Nima E. Gorji Ugo Reggiani Leonardo Sandrolini |
| author_sort | Nima E. Gorji |
| collection | DOAJ |
| description | The band gap, grain size, and topography of a Cu(In,Ga)Se2 (CIGSe) thin film solar cell are analyzed using surface photovoltage spectroscopy (SPV) and atomic force microscopy (AFM) techniques. From the steep increase in SPV signal the band gap of the CIGSe absorber, In2S3 and ZnO layers are extracted and found to be 1.1, 1.3 and 2.6 eV, respectively. Already below the band gap of ZnO layer, a slight SPV response at 1.40 eV photon energies is observed indicating the presence of deep donor states. The root mean square (rms) of the surface roughness is found to be 37.8 nm from AFM surface topography maps. The grain sizes are almost uniform and smaller than 1 μm. |
| format | Article |
| id | doaj-art-f3d67fef6c51491cad3a2fd6d481dbf3 |
| institution | Kabale University |
| issn | 1110-662X 1687-529X |
| language | English |
| publishDate | 2015-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Photoenergy |
| spelling | doaj-art-f3d67fef6c51491cad3a2fd6d481dbf32025-02-03T01:28:06ZengWileyInternational Journal of Photoenergy1110-662X1687-529X2015-01-01201510.1155/2015/829530829530Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar CellsNima E. Gorji0Ugo Reggiani1Leonardo Sandrolini2Department of Electrical, Electronic, and Information Engineering, University of Bologna, 40136 Bologna, ItalyDepartment of Electrical, Electronic, and Information Engineering, University of Bologna, 40136 Bologna, ItalyDepartment of Electrical, Electronic, and Information Engineering, University of Bologna, 40136 Bologna, ItalyThe band gap, grain size, and topography of a Cu(In,Ga)Se2 (CIGSe) thin film solar cell are analyzed using surface photovoltage spectroscopy (SPV) and atomic force microscopy (AFM) techniques. From the steep increase in SPV signal the band gap of the CIGSe absorber, In2S3 and ZnO layers are extracted and found to be 1.1, 1.3 and 2.6 eV, respectively. Already below the band gap of ZnO layer, a slight SPV response at 1.40 eV photon energies is observed indicating the presence of deep donor states. The root mean square (rms) of the surface roughness is found to be 37.8 nm from AFM surface topography maps. The grain sizes are almost uniform and smaller than 1 μm.http://dx.doi.org/10.1155/2015/829530 |
| spellingShingle | Nima E. Gorji Ugo Reggiani Leonardo Sandrolini Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells International Journal of Photoenergy |
| title | Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells |
| title_full | Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells |
| title_fullStr | Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells |
| title_full_unstemmed | Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells |
| title_short | Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells |
| title_sort | surface photovoltage spectroscopy and afm analysis of cigse thin film solar cells |
| url | http://dx.doi.org/10.1155/2015/829530 |
| work_keys_str_mv | AT nimaegorji surfacephotovoltagespectroscopyandafmanalysisofcigsethinfilmsolarcells AT ugoreggiani surfacephotovoltagespectroscopyandafmanalysisofcigsethinfilmsolarcells AT leonardosandrolini surfacephotovoltagespectroscopyandafmanalysisofcigsethinfilmsolarcells |