Fan, S., Wu, J., & Zhao, Y. Genetic Diversity and Association of Low-Density Simple Sequence Repeat Markers with Yield Traits in Wheat Under Salt Stress. MDPI AG.
Chicago Style (17th ed.) CitationFan, Shugao, Jiawei Wu, and Ying Zhao. Genetic Diversity and Association of Low-Density Simple Sequence Repeat Markers with Yield Traits in Wheat Under Salt Stress. MDPI AG.
MLA (9th ed.) CitationFan, Shugao, et al. Genetic Diversity and Association of Low-Density Simple Sequence Repeat Markers with Yield Traits in Wheat Under Salt Stress. MDPI AG.
Warning: These citations may not always be 100% accurate.