Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index
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| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1981-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.8.167 |
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| _version_ | 1832552191818203136 |
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| author | Minoru Tanaka Susumu Kasukabe |
| author_facet | Minoru Tanaka Susumu Kasukabe |
| author_sort | Minoru Tanaka |
| collection | DOAJ |
| format | Article |
| id | doaj-art-ef64e0a1500a43c7924ff0601f015436 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1981-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-ef64e0a1500a43c7924ff0601f0154362025-02-03T05:59:29ZengWileyActive and Passive Electronic Components0882-75161563-50311981-01-0183-416717410.1155/APEC.8.167Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic IndexMinoru TanakaSusumu Kasukabehttp://dx.doi.org/10.1155/APEC.8.167 |
| spellingShingle | Minoru Tanaka Susumu Kasukabe Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index Active and Passive Electronic Components |
| title | Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index |
| title_full | Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index |
| title_fullStr | Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index |
| title_full_unstemmed | Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index |
| title_short | Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index |
| title_sort | reliability evaluation of thick film resistors through measurement of third harmonic index |
| url | http://dx.doi.org/10.1155/APEC.8.167 |
| work_keys_str_mv | AT minorutanaka reliabilityevaluationofthickfilmresistorsthroughmeasurementofthirdharmonicindex AT susumukasukabe reliabilityevaluationofthickfilmresistorsthroughmeasurementofthirdharmonicindex |