Tanaka, M., & Kasukabe, S. Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index. Wiley.
Chicago Style (17th ed.) CitationTanaka, Minoru, and Susumu Kasukabe. Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index. Wiley.
MLA (9th ed.) CitationTanaka, Minoru, and Susumu Kasukabe. Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index. Wiley.
Warning: These citations may not always be 100% accurate.