Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

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Bibliographic Details
Main Authors:	M. Prudenziati, F. Forlani, M. Cocito, A. Cattaneo
Format:	Article
Language:	English
Published:	Wiley 1977-01-01
Series:	Active and Passive Electronic Components
Online Access:	http://dx.doi.org/10.1155/APEC.4.205
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