Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors
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| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1977-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.4.205 |
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| _version_ | 1832560423435501568 |
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| author | M. Prudenziati F. Forlani M. Cocito A. Cattaneo |
| author_facet | M. Prudenziati F. Forlani M. Cocito A. Cattaneo |
| author_sort | M. Prudenziati |
| collection | DOAJ |
| format | Article |
| id | doaj-art-edf9fc752d7c468489f2d288ccec7862 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1977-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-edf9fc752d7c468489f2d288ccec78622025-02-03T01:27:46ZengWileyActive and Passive Electronic Components0882-75161563-50311977-01-0143-420521110.1155/APEC.4.205Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film ResistorsM. PrudenziatiF. ForlaniM. CocitoA. Cattaneohttp://dx.doi.org/10.1155/APEC.4.205 |
| spellingShingle | M. Prudenziati F. Forlani M. Cocito A. Cattaneo Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors Active and Passive Electronic Components |
| title | Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors |
| title_full | Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors |
| title_fullStr | Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors |
| title_full_unstemmed | Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors |
| title_short | Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors |
| title_sort | influence of the metal migration from screen and fired terminations on the electrical characteristics of thick film resistors |
| url | http://dx.doi.org/10.1155/APEC.4.205 |
| work_keys_str_mv | AT mprudenziati influenceofthemetalmigrationfromscreenandfiredterminationsontheelectricalcharacteristicsofthickfilmresistors AT fforlani influenceofthemetalmigrationfromscreenandfiredterminationsontheelectricalcharacteristicsofthickfilmresistors AT mcocito influenceofthemetalmigrationfromscreenandfiredterminationsontheelectricalcharacteristicsofthickfilmresistors AT acattaneo influenceofthemetalmigrationfromscreenandfiredterminationsontheelectricalcharacteristicsofthickfilmresistors |