Jin, R., Wang, Y., Li, L., Xu, L., Pu, K., Zeng, J., & Darwish, M. Comparative study of electro‐thermal characteristics of 4500 V diffusion‐CS IGBT and buried‐CS IGBT. Wiley.
Chicago Style (17th ed.) CitationJin, Rui, Yaohua Wang, Li Li, Longlai Xu, Kui Pu, Jun Zeng, and Mohamed Darwish. Comparative Study of Electro‐thermal Characteristics of 4500 V Diffusion‐CS IGBT and Buried‐CS IGBT. Wiley.
MLA (9th ed.) CitationJin, Rui, et al. Comparative Study of Electro‐thermal Characteristics of 4500 V Diffusion‐CS IGBT and Buried‐CS IGBT. Wiley.
Warning: These citations may not always be 100% accurate.