APA (7th ed.) Citation

Lin, C., Tseng, T., & Tsai, T. A Digital Twin Framework With Bayesian Optimization and Deep Learning for Semiconductor Process Control. IEEE.

Chicago Style (17th ed.) Citation

Lin, Chin-Yi, Tzu-Liang Tseng, and Tsung-Han Tsai. A Digital Twin Framework With Bayesian Optimization and Deep Learning for Semiconductor Process Control. IEEE.

MLA (9th ed.) Citation

Lin, Chin-Yi, et al. A Digital Twin Framework With Bayesian Optimization and Deep Learning for Semiconductor Process Control. IEEE.