Discovering leaf and stripe rust resistance in soft red winter wheat through genome‐wide association studies
Abstract Leaf rust (LR) and stripe rust (YR), which are caused by Puccinia triticina and Puccinia striiformis, respectively, are among the most devastating wheat rusts worldwide. These diseases can be managed by using genetically resistant cultivars, an economical and environmentally safer alternati...
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| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2025-06-01
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| Series: | The Plant Genome |
| Online Access: | https://doi.org/10.1002/tpg2.70055 |
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