Inference and Optimal Design on Partially Accelerated Life Tests for the Power Half-Logistic Distribution Under Adaptive Type II Progressive Censoring

This study explores accelerated life tests to examine the durability of highly reliable products. These tests involve applying higher stress levels, such as increased temperature, voltage, or pressure, that cause early failures. The power half-logistic (PHL) distribution is utilized due to its flexi...

Full description

Saved in:
Bibliographic Details
Main Authors: Hanan Haj Ahmad, Mahmoud M. El-Awady
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Mathematics
Subjects:
Online Access:https://www.mdpi.com/2227-7390/13/3/394
Tags: Add Tag
No Tags, Be the first to tag this record!