Vejo, L., Castro, P., Manana, M., Laso, A., Lecuna, R., Bustamante, S., & Sainz, E. Experimental Study of Dynamic Line Rating Applied to High-Temperature Low-Sag Conductors. MDPI AG.
Chicago Style (17th ed.) CitationVejo, Luis, Pablo Castro, Mario Manana, Alberto Laso, Ramon Lecuna, Sergio Bustamante, and Eugenio Sainz. Experimental Study of Dynamic Line Rating Applied to High-Temperature Low-Sag Conductors. MDPI AG.
MLA (9th ed.) CitationVejo, Luis, et al. Experimental Study of Dynamic Line Rating Applied to High-Temperature Low-Sag Conductors. MDPI AG.
Warning: These citations may not always be 100% accurate.