(In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD

The (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> photodetectors were fabricated on the single-crystalline (In<italic><sub>x</sub>...

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Main Authors: Ke Zhang, Qian Feng, Lu Huang, Zhuangzhuang Hu, Zhaoqing Feng, Ang Li, Hong Zhou, Xiaoli Lu, Chunfu Zhang, Jincheng Zhang, Yue Hao
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Photonics Journal
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Online Access:https://ieeexplore.ieee.org/document/8368328/
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author Ke Zhang
Qian Feng
Lu Huang
Zhuangzhuang Hu
Zhaoqing Feng
Ang Li
Hong Zhou
Xiaoli Lu
Chunfu Zhang
Jincheng Zhang
Yue Hao
author_facet Ke Zhang
Qian Feng
Lu Huang
Zhuangzhuang Hu
Zhaoqing Feng
Ang Li
Hong Zhou
Xiaoli Lu
Chunfu Zhang
Jincheng Zhang
Yue Hao
author_sort Ke Zhang
collection DOAJ
description The (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> photodetectors were fabricated on the single-crystalline (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic> <sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> films deposited on sapphire substrate by pulsed laser deposition. The structural and optical properties of the epilayers were investigated using high-resolution X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, and transmittance spectra. With decreasing the growth temperature, the indium composition increased and the bandgap decreased from 4.99&#x00A0;eV to 4.89&#x00A0;eV (In<sub>0.05 </sub>Ga<sub>0.95</sub>)<sub>2</sub>O<sub>3</sub> and 4.78&#x00A0;eV (In<sub>0.08</sub>Ga<sub>0.92</sub>)<sub>2</sub>O <sub>3</sub>. Furthermore, the photoelectrical characteristics of (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub> <italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> detectors were also studied. The enhanced <inline-formula> <tex-math notation="LaTeX">$I_{{\text{photo}}}$</tex-math></inline-formula>, <inline-formula><tex-math notation="LaTeX"> $I_{{\text{dark}}}$</tex-math></inline-formula>, and responsivity <italic>R</italic> were achieved in the devices with higher In composition, while a larger number of defects were introduced, resulting in the significant persistent photoconductivity.
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spelling doaj-art-e823db8dfebb47bcbb4f66dc50f055932025-08-20T03:32:46ZengIEEEIEEE Photonics Journal1943-06552018-01-011031810.1109/JPHOT.2018.28419688368328(In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLDKe Zhang0https://orcid.org/0000-0003-4699-0292Qian Feng1https://orcid.org/0000-0001-7655-2600Lu Huang2Zhuangzhuang Hu3Zhaoqing Feng4Ang Li5Hong Zhou6https://orcid.org/0000-0002-0741-7568Xiaoli Lu7https://orcid.org/0000-0003-3689-5996Chunfu Zhang8https://orcid.org/0000-0001-9555-3377Jincheng Zhang9https://orcid.org/0000-0001-7332-6704Yue Hao10Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaWide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi&#x0027;an, ChinaThe (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> photodetectors were fabricated on the single-crystalline (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic> <sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> films deposited on sapphire substrate by pulsed laser deposition. The structural and optical properties of the epilayers were investigated using high-resolution X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, and transmittance spectra. With decreasing the growth temperature, the indium composition increased and the bandgap decreased from 4.99&#x00A0;eV to 4.89&#x00A0;eV (In<sub>0.05 </sub>Ga<sub>0.95</sub>)<sub>2</sub>O<sub>3</sub> and 4.78&#x00A0;eV (In<sub>0.08</sub>Ga<sub>0.92</sub>)<sub>2</sub>O <sub>3</sub>. Furthermore, the photoelectrical characteristics of (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub> <italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3</sub> detectors were also studied. The enhanced <inline-formula> <tex-math notation="LaTeX">$I_{{\text{photo}}}$</tex-math></inline-formula>, <inline-formula><tex-math notation="LaTeX"> $I_{{\text{dark}}}$</tex-math></inline-formula>, and responsivity <italic>R</italic> were achieved in the devices with higher In composition, while a larger number of defects were introduced, resulting in the significant persistent photoconductivity.https://ieeexplore.ieee.org/document/8368328/(InxGa1−x)2O3photodetectorstemperaturesPLD.
spellingShingle Ke Zhang
Qian Feng
Lu Huang
Zhuangzhuang Hu
Zhaoqing Feng
Ang Li
Hong Zhou
Xiaoli Lu
Chunfu Zhang
Jincheng Zhang
Yue Hao
(In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
IEEE Photonics Journal
(InxGa1−x)2O3
photodetectors
temperatures
PLD.
title (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
title_full (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
title_fullStr (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
title_full_unstemmed (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
title_short (In<italic><sub>x</sub></italic>Ga<sub>1&#x2212;</sub><italic><sub>x</sub></italic>)<sub>2</sub>O<sub>3 </sub> Photodetectors Fabricated on Sapphire at Different Temperatures by PLD
title_sort in italic sub x sub italic ga sub 1 x2212 sub italic sub x sub italic sub 2 sub o sub 3 sub photodetectors fabricated on sapphire at different temperatures by pld
topic (InxGa1−x)2O3
photodetectors
temperatures
PLD.
url https://ieeexplore.ieee.org/document/8368328/
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